MILPITAS, Calif.--(BUSINESS WIRE)-- Nanometrics Incorporated (NANO) (NASDAQ: NANO), a leading supplier of advanced process control systems and solutions, will release its first quarter 2012 financial results after market close on April 26, 2012. A conference call to discuss the results will be held at 4:30 PM ET.

To participate in Nanometrics first quarter 2012 conference call:

Dial-In Numbers:
(877) 374-4041 (U.S.)
(253) 237-1156 (Intl)

A live webcast of the conference call can be accessed from Nanometrics website at www.nanometrics.com.

If you are unable to participate during the live conference call, a webcast recording will be made available on Nanometrics website.

About Nanometrics

Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors, high-brightness LEDs, data storage devices and solar photovoltaics. Nanometrics automated and integrated systems address numerous process control applications, including critical dimension and film thickness measurement, device topography, defect inspection, overlay registration, and analysis of various other film properties such as optical, electrical and material characteristics. The companys process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics website is http://www.nanometrics.com.

Investor Relations:
Headgate Partners LLC
Claire McAdams, 530-265-9899
claire@headgatepartners.com
or
Company:
Nanometrics Incorporated
Ron Kisling, CFO, 408-545-6143
rkisling@nanometrics.com

Source: Nanometrics Incorporated

Copyright Business Wire 2012