Aehr Test Systems (NASDAQ:AEHR) has received a $2.9M follow-on order for a FOX-XP Wafer Level Test and Burn-in system and multiple WaferPak Contactors from its lead silicon carbide customer to provide additional capacity for production test and burn-in of the customer’s line of silicon carbide devices.
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This system is expected to ship during Aehr’s current fiscal Q1 ending August 31, 2021.
The FOX-XP system is configured to test eighteen silicon carbide wafers in parallel while contacting and testing 100% of the devices on each wafer.
“Silicon carbide continues to be promising as a key growth driver for Aehr, and we anticipate that silicon carbide wafer level burn-in will become the industry standard for low cost and 100% traceability for burn-in and reliability screening,” commented Gayn Erickson, President and CEO of Aehr.